Keysight Technologies, Inc., a technology company that provides design and validation solutions to help accelerate innovation to connect and protect the world, announced that MISIC Microelectronics has selected the Keysight S930705B Modulation Distortion solution to enable fast and accurate characterization of the modulation distortion of the active device. of the company's microwave devices and components.
Demand for higher data throughput and lower latency is pushing device specifications and operational standards toward wideband modulation. However, wideband performance significantly increases noise, which introduces additional testing complexity and measurement uncertainty for semiconductor manufacturers like MISIC.
By employing Keysight S930705B modulation distortion software running on the N5245B PNA-X Microwave Network Analyzer, MISIC can make measurements of microwave devices with extremely low residual error vector magnitude (EVM) to obtain a complete picture of device performance without interference from the test system. This is because the S930705B provides non-linear device-under-test (DUT) behaviors such as EVM, noise power ratio (NPR), and adjacent channel power ratio (ACPR) under modulated stimulus conditions.
As a result, MISIC can achieve excellent signal fidelity and accurate modulated measurements at 5G, 6G, microwave, and millimeter wave frequencies.
“Keysight offers us a cost-effective test solution that provides us with highly accurate measurements while eliminating system noise and interference,” said Debin Hou, GM, MISIC Microelectronics . “The single test setup allows for complete characterization of an amplifier that would otherwise require two separate test stations or the use of a complex and expensive switching matrix.”
“Thanks to Keysight’s modulation distortion solution, MISIC has the right combination of speed and measurement integrity to gain a deeper understanding of your designs and accelerate your research and development workflow,” added Peng Cao, vice-president. president and general manager of Keysight's wireless testing group. “As an integrated solution, it eliminates the need for a full suite of equipment tests and reduces the cost of device development and validation.”
